The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 13, 2019
Filed:
Jan. 11, 2016
Oracle International Corporation, Redwood Shores, CA (US);
Prasad V. Bagal, Saratoga, CA (US);
Sameer Arun Joshi, San Jose, CA (US);
Hanlin Daniel Chien, San Jose, CA (US);
Ricardo Rey Diez, Zapopan, MX;
David Cavazos Woo, Zapopan, MX;
Emily Ronshien Su, Mountain View, CA (US);
Sha Chang, Palo Alto, CA (US);
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
Duplicate bug report detection using machine learning algorithms and automated feedback incorporation is disclosed. For each set of bug reports, a user-classification of the set of bug reports as including duplicate bug reports or non-duplicate bug reports is identified. Also for each set of bug reports, correlation values corresponding to a respective feature, of a plurality of features, between bug reports in the set of bug reports is identified. Based on the user-classifications and the correlation values, a model is generated to identify any set of bug reports as including duplicate bug reports or non-duplicate bug reports. The model is applied to classify a particular bug report and a candidate bug report as duplicate bug reports or non-duplicate bug reports.