The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 13, 2019

Filed:

Mar. 20, 2017
Applicant:

Sap SE, Walldorf, DE;

Inventors:

Robert Meusel, Mannheim, DE;

Jaakob Kind, Heidelberg, DE;

Atreju Florian Tauschinsky, Walldorf, DE;

Janick Frasch, Mannheim, DE;

Minji Lee, Heidelberg, DE;

Michael Otto, Walldorf, DE;

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); G06F 16/2458 (2019.01); G05B 23/02 (2006.01); G06N 7/00 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G05B 23/024 (2013.01); G06F 11/0721 (2013.01); G06F 16/2477 (2019.01); G06N 7/005 (2013.01);
Abstract

Some embodiments include reception of a time-series of a respective data value generated by each of a plurality of sensors, calculation of a regression associated with a first sensor of the plurality of sensors based on the received plurality of time-series, the regression being a function of the respective data values of the others of the plurality of data sources, reception of respective data values associated with a time from and generated by each the plurality of respective sensors, determination of a predicted value associated with the time for the first sensor based on the regression associated with the first sensor and on the respective data values associated with the time, comparison of the predicted value with the received value associated with the time and generated by the first sensor, and determination of a value indicating a likelihood of an anomaly based on the comparison.


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