The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 13, 2019

Filed:

Jul. 19, 2017
Applicant:

Samsung Electronics Co., Ltd., Gyeonggi-do, KR;

Inventors:

Jong-hun Lee, Seoul, KR;

Jae-un Park, Seoul, KR;

Si-hoon Song, Seoul, KR;

Myung-sun Kim, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/38 (2018.01); G06F 9/30 (2018.01); G06F 15/82 (2006.01); G06F 8/41 (2018.01);
U.S. Cl.
CPC ...
G06F 9/3853 (2013.01); G06F 8/41 (2013.01); G06F 9/30072 (2013.01); G06F 9/30079 (2013.01); G06F 9/30152 (2013.01); G06F 15/82 (2013.01);
Abstract

An electronic apparatus generating compiled data used in a very long instruction word (VLIW) processor including a plurality of function units is provided. The electronic apparatus includes a storage and a processor configured to control the storage to store the compiled data in which a plurality of VLIW instructions are compiled, identify a VLIW instruction from the compiled data; and update, if a multi-cycle no operation (nop) instruction for the plurality of function units is identified within a cycle corresponding to a latency of the identified VLIW instruction and if an end cycle of another VLIW instruction is within the cycle corresponding to the latency of the identified VLIW instruction, the compiled data by including information on a cycle difference between an end cycle of the identified VLIW instruction and the end cycle of the another VLIW instruction in the multi-cycle nop instruction.


Find Patent Forward Citations

Loading…