The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 13, 2019
Filed:
Mar. 16, 2017
Fanuc Corporation, Yamanashi, JP;
Tomoyuki Yamamoto, Yamanashi, JP;
Hiromitsu Takahashi, Yamanashi, JP;
FANUC CORPORATION, Yamanashi, JP;
Abstract
A test system comprises a plurality of test devices which are connected to a plurality of machines and which perform a basic test, and a test management device which is connected to the plurality of test devices via a network. The test management device includes an additional test setting part which sets an additional test for determining a cause of an abnormality when determining that the machine has the abnormality. The test management device includes an adjustment part which sets the test device that performs the additional test. The adjustment part determines that the basic test planned to be performed by the test device that performs the additional test is performed by the other test device.