The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 13, 2019
Filed:
Oct. 29, 2018
Applicant:
Hp Indigo, B.v., Amstelveen, NL;
Inventors:
Shmuel Borenstain, Ness Ziona, IL;
Ami Halfon, Ness Ziona, IL;
Henryk Birecki, Palo Alto, CA (US);
Seongsik Chang, Palo Alto, CA (US);
Assignee:
HP Indigo B.V., Amstelveen, NL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G 15/00 (2006.01); G03G 15/02 (2006.01); G03G 15/10 (2006.01); G03G 15/16 (2006.01); G03G 21/00 (2006.01);
U.S. Cl.
CPC ...
G03G 15/0233 (2013.01); G03G 15/025 (2013.01); G03G 15/105 (2013.01); G03G 15/1645 (2013.01); G03G 15/50 (2013.01); G03G 15/5037 (2013.01); G03G 15/10 (2013.01); G03G 21/0076 (2013.01);
Abstract
In one example, a method for calibrating a position of a charge roller is described. The method may include a processor positioning a first end of a charge roller to a first plurality of index positions, determining a capacitance between the charge roller and a photoconductor imaging plate at each of the first plurality of index positions, determining a first index position of the first plurality of index positions with a greatest change in capacitance, and calibrating a position of the charge roller based upon the first index position.