The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 13, 2019

Filed:

Nov. 27, 2015
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Young Ik Kim, Suwon-si, KR;

Jin-Woo Park, Osan-si, KR;

Eun Jeong Jo, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/24 (2006.01); G03B 42/02 (2006.01); G01T 1/20 (2006.01);
U.S. Cl.
CPC ...
G03B 42/025 (2013.01); G01T 1/2018 (2013.01); G01T 1/244 (2013.01);
Abstract

Disclosed herein is an X-ray imaging apparatus having an improved structure which is configured for preventing an entrance of foreign materials. The X-ray imaging apparatus includes: an X-ray source configured to generate X-rays, and to irradiate the generated X-rays; an X-ray detector configured to detect the irradiated X-rays; and a first frame and a second frame coupled with each other to form an outer appearance of the X-ray detector. The first frame is tightly coupled with the second frame so that no gap exists between the first frame and the second frame in order to prevent a foreign material from entering the inside of the X-ray detector.


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