The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 13, 2019
Filed:
Jul. 01, 2015
Olympus Corporation, Shibuya-ku, Tokyo, JP;
Nobuhiro Takamizawa, Kanagawa, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
It is possible to easily acquire an original image of a specimen that satisfies necessary conditions for generating a super-resolution image. The present invention provides a scanning microscope apparatus that includes an objective lens that irradiates a specimen with laser light emitted from a laser light source; a scanning portion that scans the laser light irradiated onto the specimen via the objective lens; and a PC that acquires an original image of the specimen, calculates, from the magnification of the objective lens, information about the number of pixels of the original image or information about the zoom magnification of the original image that achieves the per-pixel pixel resolution needed to generate a super-resolution image, and controls the scanning portion or image acquisition according to the calculated information about the number of pixels or information about the zoom magnification.