The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 13, 2019
Filed:
Dec. 09, 2015
Olympus Corporation, Shibuya-ku, Tokyo, JP;
Yoshihiro Ue, Hidaka, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
A microscope system includes a microscope apparatus and a computing device. The microscope apparatus obtains image data of a surface to be observed of a sample in each of the plurality of states having different setting values of a correction collar. The computing device calculates an evaluation value of image data on the basis of each of the plural pieces of image data. A process in which the microscope apparatus obtains the plural pieces of image data is repeated in such a way that a distribution range and an average interval of the setting values are narrowed in each repetition, and that the setting value that corresponds to a maximum evaluation value is included within the distribution range. The computing device calculates the setting value for correcting a spherical aberration on the basis of the evaluation values and the setting values that correspond to the evaluation values.