The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 13, 2019

Filed:

May. 11, 2016
Applicant:

Groundmetrics, Inc., San Diego, CA (US);

Inventors:

Michael Wilt, Walnut Creek, CA (US);

Karl N Kappler, Victoria, CA;

Assignee:

GroundMetrics, Inc., San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01); G01V 3/38 (2006.01); G01V 3/08 (2006.01); G01V 3/30 (2006.01); G01V 3/26 (2006.01); G01V 3/34 (2006.01);
U.S. Cl.
CPC ...
G01V 3/38 (2013.01); G01V 3/08 (2013.01); G01V 3/26 (2013.01); G01V 3/30 (2013.01); G01V 3/34 (2013.01);
Abstract

An electromagnetic data acquisition system and an associated method for measuring subsurface structures with electromagnetic fields is employed for removing near surface effects from borehole to surface electromagnetic data. Preferably, the system is used to obtain information about deep, target structures located deep below the Earth, especially in oil and gas fields, while mitigating the effect of near surface geological shallow structures on collected electromagnetic (EM) data by using a series of electromagnetic measurements and data treatments that preferentially illuminate near surface geologic shallow structures so that the shallow structures may be recovered separately from deep structures of interest.


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