The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 13, 2019
Filed:
Mar. 26, 2015
Applicant:
Cgg Services SA, Massy, FR;
Inventor:
Benjamin Roure, Calgary, CA;
Assignee:
CGG SERVICES SAS, Massy, FR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 1/30 (2006.01);
U.S. Cl.
CPC ...
G01V 1/306 (2013.01); G01V 2210/626 (2013.01);
Abstract
A method for evaluating anisotropy parameters using statistical moments calculates second and third central moments using reflectivity values associated with pairs of incidence and azimuth angles. The method further determines tangential and normal weaknesses for the location using the calculated second and third central moments for different incident angles. Linear and non-linear inversions of statistical moments are used to estimate the fracture weaknesses, anisotropic gradient (biased and unbiased), anellipticity variation and unambiguous orientation.