The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 13, 2019

Filed:

Sep. 29, 2016
Applicant:

Murata Manufacturing Co., Ltd., Kyoto, JP;

Inventors:

Koichi Takizawa, Kyoto, JP;

Yoshiharu Yoshii, Kyoto, JP;

Yoshiyuki Tokiwa, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 13/84 (2006.01); G01S 13/82 (2006.01); G01S 13/02 (2006.01);
U.S. Cl.
CPC ...
G01S 13/84 (2013.01); G01S 13/825 (2013.01); G01S 2013/0245 (2013.01);
Abstract

A measurement apparatus outputs from a first antenna pair transmission signals (St) and (St) whose phase difference (Δϕ) changes over time. A target object simultaneously receives the transmission signals (St) and (St) from a target-side antenna and returns to the measurement apparatus information (Dϕ) according to the positional relationship between the target object and the measurement apparatus determined from a reception signal (Sr). The measurement apparatus outputs from a second antenna pair transmission signals (St) and (St) whose phase difference (Δϕ) changes over time. The target object simultaneously receives the transmission signals (St) and (St) from the target-side antenna and returns to the measurement apparatus the information (Dϕ) corresponding to the positional relationship between the target object and the measurement apparatus determined from a reception signal (Sr). The measurement apparatus identifies a direction (θ) of the target object on the basis of these two pieces of information (Dϕ).


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