The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 13, 2019

Filed:

Oct. 31, 2017
Applicant:

Keysight Technologies, Inc., Minneapolis, MN (US);

Inventors:

Sho Okuyama, Kobe, JP;

Mitsuru Yokoyama, Kobe, JP;

Assignee:

Keysight Technologies, Inc., Santa Rosa, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/319 (2006.01); H04L 27/20 (2006.01); H04L 27/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31903 (2013.01); H04L 27/2057 (2013.01); H04L 2027/0065 (2013.01); H04L 2027/0075 (2013.01);
Abstract

A method for operating a data processing system to compute the response of a DUT to a modulated input signal is disclosed. The method includes determining a set of parameters for a first model of the DUT from a plurality of measurements of output values from the DUT, each output value includes a measurement of a gain and phase shift provided by the DUT when the DUT is stimulated with a single tone input signal having a frequency in a frequency range determined by the modulated signal. The method also determines a second model that characterizes noise generated by the DUT at the single tone input signals. A performance parameter for an output signal that would be obtained by applying the modulated input signal to an input of the DUT, and receiving the output of the DUT is then determined from the first and second models.


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