The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 13, 2019
Filed:
Sep. 15, 2017
Fu Tai Hua Industry (Shenzhen) Co., Ltd., Shenzhen, CN;
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
Eddy Liu, New Taipei, TW;
Wei-Da Yang, New Taipei, TW;
Xiao-Feng Hou, Shenzhen, CN;
Guo-Dong Liang, Shenzhen, CN;
Fu Tai Hua Industry (Shenzhen) Co., Ltd., Shenzhen, CN;
HON HAI PRECISION INDUSTRY CO., LTD., New Taipei, TW;
Abstract
A system for determining a position of a test probe of a test fixture applied to a test pad on a dummy board is disclosed. The test pad includes conductive test zones, resistors, a first insulating zone, and a plurality of second insulating zones. Each resistor has a different resistance. Each resistor is connected to a different test zone. The test zones include a first test zone and a surrounding plurality of second test zones. The first test zone is insulated from the second test zones by the first insulating zone. Adjacent second test zones are insulated from each other by a different second insulating zone. Probe correction can be carried out according to the value of resistance read by a resistance measuring device which stores a correspondence table, and position of the probe adjusted accordingly.