The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 13, 2019
Filed:
Jul. 20, 2017
Applicant:
Seqvera Ltd. Oy, Helsinki, FI;
Inventors:
Michael Gasik, Helsinki, FI;
Yevgen Bilotsky, Melbourne, AU;
Assignee:
Seqvera Ltd. Oy, Helsinki, FI;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/50 (2006.01); G01N 33/483 (2006.01); G01N 33/487 (2006.01); G01N 33/537 (2006.01); G01N 33/00 (2006.01);
U.S. Cl.
CPC ...
G01N 33/5008 (2013.01); G01N 33/4833 (2013.01); G01N 33/48792 (2013.01); G01N 33/5375 (2013.01); G01N 33/00 (2013.01);
Abstract
The invention discloses a method for in vitro testing of specimens, such as biomaterials, to obtain history-dependent, time-invariant functional materials properties using time-convolution and idempotent analysis. The purpose of the method is to measure these properties using a data processing without limitations of materials models, the properties linearity or material homogeneity.