The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 13, 2019

Filed:

Jun. 04, 2018
Applicant:

Olympus Corporation, Tokyo, JP;

Inventors:

Munenori Fukunishi, Tokyo, JP;

Naoyuki Miyashita, Tokorozawa, JP;

Kiyotomi Ogawa, Tokyo, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/954 (2006.01); G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
G01N 21/8806 (2013.01); G01N 21/954 (2013.01); G01N 2021/9542 (2013.01);
Abstract

In a measurement device, an imaging unit generates a first image and a second image. A subject distance detection unit detects a subject distance. A motion detection unit detects an amount of motion of the imaging unit. A measurement availability determination unit determines whether or not measurement is executable by comparing the amount of motion with an allowable threshold value according to the subject distance. A measurement processing unit executes a measurement process on the basis of the first image and the second image when the measurement availability determination unit determines that the measurement is executable.


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