The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 13, 2019
Filed:
Mar. 23, 2016
Commissariat a L'energie Atomique ET Aux Energies Alternatives, Paris, FR;
Horiba Abx Sas, Montpellier, FR;
Iprasense Sas, Clapiers, FR;
Cedric Allier, Grenoble, FR;
Pierre Blandin, Coublevie, FR;
Anais Ali Cherif, Montpellier, FR;
Lionel Herve, Corenc, FR;
COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES, Paris, FR;
HORIBA ABX SAS, Montpellier, FR;
IPRASENSE SAS, Clapiers, FR;
Abstract
A method for identifying a particle contained in a sample, including illuminating the sample using a light source, the light source producing an incident light wave propagating toward the sample, then acquiring, using a matrix-array photodetector, an image of the sample, the sample being placed between the light source and the photodetector such that the matrix-array photodetector is exposed to a light wave that is the result of interference between the incident light wave and a diffraction wave produced by each particle. The method further includes applying a numerical reconstruction algorithm to the image acquired by the photodetector, to estimate a characteristic quantity of the light wave reaching the detector, at a plurality of distances from the detector. The variation in the characteristic quantity as a function of distance allows the particle to be identified.