The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 13, 2019
Filed:
Apr. 18, 2017
International Business Machines Corporation, Armonk, NY (US);
Tsuyoshi Ide, Harrison, NY (US);
Jayant R. Kalagnanam, Briarcliff Manor, NY (US);
Dung T. Phan, Ossining, NY (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
A method includes capturing multivariate time-series data comprising two or more data sets from a system captured over a past time period and a present time period, applying at least two sliding time windows to the multivariate time-series data in determining respective data matrices, computing an orthonormal matrix for each of the data matrices, wherein the orthonormal matrix is a signature of fluctuation patterns of a respective data matrix, computing a difference between at least two of the data sets in the past and the present time periods through the orthonormal matrices, and detecting a fault in at least one of the systems by comparing the difference to a threshold.