The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 13, 2019

Filed:

Jan. 24, 2018
Applicant:

Toyota Production Engineering, Munakata, Fukuoka Prefecture, JP;

Inventors:

Takuya Sakamoto, Munakata, JP;

Yuki Ishida, Fukuoka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 1/00 (2006.01); G01L 1/24 (2006.01); G06T 11/20 (2006.01); G06T 7/00 (2017.01); G01N 3/08 (2006.01); G01N 19/00 (2006.01); G01N 21/70 (2006.01); G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
G01L 1/24 (2013.01); G01N 3/08 (2013.01); G01N 19/00 (2013.01); G06T 7/97 (2017.01); G06T 11/20 (2013.01); G01N 21/70 (2013.01); G01N 21/8803 (2013.01);
Abstract

A strain amount calculation system includes an imaging unit, and a strain amount calculation device that acquires an image taken by the imaging unit, measures luminescent brightness from the acquired image, calculates an amount of strain on the object caused by a load on the object, based on a temporal change in the measured luminescent brightness, and outputs information on the calculated strain amount.


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