The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 13, 2019
Filed:
Jun. 19, 2017
Ushio Denki Kabushiki Kaisha, Tokyo, JP;
Masashi Okamoto, Tokyo, JP;
Tsukasa Matsuo, Tokyo, JP;
Ushio Denki Kabushiki Kaisha, Tokyo, JP;
Abstract
When the optical system is illuminated with an illumination light flux emitted from one extant input image point, an interference image generated by superimposing an extant output light flux output from the optical system and a reference light flux coherent with the extant output light flux is imaged to acquire interference image data, and thus to acquire measured phase distribution, and this acquisition operation is applied to each extant input image point. Thus, each measured phase distribution is expanded by expanding functions μn(u, v) having coordinates (u, v) on a phase defining plane as a variable to be represented as a sum with coefficients Σn{Ajn·μn(u, v)}. When the optical system is illuminated with a virtual illumination light flux, a phase Ψ(u, v) of a virtual output light flux is determined by performing interpolation calculation based on coordinates of a virtual light emitting point.