Systems and methods for electrostatic trapping of contaminants in cryogenic refrigeration systems

Abstract

Systems and methods for improving the performance of dilution refrigeration systems are described. Electrostatic cryogenic cold traps employed in the helium circuit of a dilution refrigerator improve the removal efficiency of contaminants from the helium circuit. An ionization source ionizes at least a portion of a refrigerant that includes helium and number of contaminants. The ionized refrigerant passes through an electrostatic cryogenic cold trap that includes a number of surfaces at one or more temperatures along at least a portion of the fluid passage between the cold trap inlet and the cold trap outlet. A high voltage source coupled to the surfaces to causes a first plurality of surfaces to function as electrodes at a first potential and a second plurality of surfaces to function as electrodes at a second potential. As ionized contaminants release their charge on the electrodes, the contaminants bond to the electrodes.