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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10378416 B1

PDFFull Text
Date of Patent:
Aug. 13, 2019

Filed:

May. 26, 2016

Analyzing apparatus and exhaust gas treating system

Applicant:

Fuji Electric Co., Ltd., Kanagawa, JP;

Inventors:

Ryoichi Higashi, Hino, JP;

Masaya Tabaru, Hino, JP;

Kazuhiro Koizumi, Sagamihara, JP;

Michiyasu Okada, Hachioji, JP;

Kozo Akao, Tama, JP;

Assignee:

FUJI ELECTRIC CO., LTD., Kanagawa, JP;

Attorney:
Primary Examiner:

Son T Le

Assistant Examiner:

Alexander A Mercado

Int. Cl.
CPC ...
G01N 1/22 (2006.01); F01N 11/00 (2006.01); F01N 3/021 (2006.01); F01N 3/04 (2006.01); G01M 15/10 (2006.01); G01N 21/3504 (2014.01); G01N 21/15 (2006.01); G01N 21/85 (2006.01); G01N 33/00 (2006.01); G01N 21/31 (2006.01); G01N 21/33 (2006.01); G01N 21/27 (2006.01);
U.S. Cl.
CPC ...
F01N 11/007 (2013.01); F01N 3/021 (2013.01); F01N 3/04 (2013.01); G01M 15/102 (2013.01); G01N 1/2202 (2013.01); G01N 1/2247 (2013.01); G01N 21/15 (2013.01); G01N 21/31 (2013.01); G01N 21/33 (2013.01); G01N 21/3504 (2013.01); G01N 21/85 (2013.01); G01N 33/0006 (2013.01); G01N 33/0029 (2013.01); G01N 21/274 (2013.01); G01N 33/004 (2013.01); G01N 33/0011 (2013.01); G01N 33/0037 (2013.01); G01N 2001/227 (2013.01); G01N 2001/2267 (2013.01); G01N 2021/151 (2013.01); G01N 2021/158 (2013.01); G01N 2021/8557 (2013.01); G01N 2021/8578 (2013.01);
Abstract

It is aimed to analyze a gas component of a to-be-analyzed gas with a reduced influence of a liquid component contained in the to-be-analyzed gas. Provided is an analyzing apparatus for analyzing a gas component of an exhaust gas that has passed through a scrubber apparatus and the like. The analyzing apparatus includes a collecting nozzle configured to collect a to-be-analyzed gas, a liquid collecting unit configured to collect a liquid component contained in the to-be-analyzed gas collected by the collecting nozzle and to allow the to-be-analyzed gas to pass therethrough, a liquid discharging unit configured to discharge the liquid component collected by the liquid collecting unit, and an analyzing unit configured to analyze a gas component of the to-be-analyzed gas that has passed through the liquid collecting unit.

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