The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 13, 2019

Filed:

Jul. 24, 2017
Applicant:

Corning Incorporated, Corning, NY (US);

Inventors:

Daniel Schnitzler, Bedburg, DE;

Helmut Schillinger, München, DE;

Assignee:

Corning Incorporated, Corning, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C03B 33/02 (2006.01); B23K 26/00 (2014.01); B23K 26/53 (2014.01); B23K 26/073 (2006.01); B23K 26/08 (2014.01); C03B 33/09 (2006.01); B23K 26/0622 (2014.01); B23K 103/00 (2006.01); B23K 101/40 (2006.01);
U.S. Cl.
CPC ...
C03B 33/0222 (2013.01); B23K 26/0006 (2013.01); B23K 26/0624 (2015.10); B23K 26/0734 (2013.01); B23K 26/0738 (2013.01); B23K 26/08 (2013.01); B23K 26/53 (2015.10); C03B 33/091 (2013.01); B23K 2101/40 (2018.08); B23K 2103/54 (2018.08);
Abstract

A workpiece may be laser processed by a method that may include forming a contour line in the workpiece, and directing an infrared laser beam onto the workpiece along or near the contour line to separate the workpiece along the contour line. The contour line may include defects in the workpiece. The infrared laser beam may have a beam profile such that a greater distribution of cumulated energy from the infrared laser beam is located in areas adjacent to the contour line than directly on the contour line.


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