The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 13, 2019

Filed:

Sep. 24, 2018
Applicant:

Nsk Ltd., Tokyo, JP;

Inventors:

Shin Kumagai, Tokyo, JP;

Kyosho Uryu, Tokyo, JP;

Nobuhiko Ando, Tokyo, JP;

Assignee:

NSK LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B62D 5/04 (2006.01); B62D 6/00 (2006.01); H02M 1/32 (2007.01); H02M 1/36 (2007.01); H02M 7/48 (2007.01); H02P 27/06 (2006.01); H02P 27/08 (2006.01); G01R 31/327 (2006.01); H02M 7/5387 (2007.01); H02P 29/024 (2016.01); H03K 17/082 (2006.01);
U.S. Cl.
CPC ...
B62D 5/0484 (2013.01); B62D 5/04 (2013.01); B62D 5/046 (2013.01); B62D 5/0487 (2013.01); B62D 6/00 (2013.01); G01R 31/3275 (2013.01); H02M 1/32 (2013.01); H02M 1/36 (2013.01); H02M 7/48 (2013.01); H02M 7/53871 (2013.01); H02P 27/06 (2013.01); H02P 27/08 (2013.01); H02P 29/0241 (2016.02); H03K 17/0822 (2013.01); B60Y 2400/3086 (2013.01); B62D 5/0463 (2013.01);
Abstract

An electronic control unit diagnoses a short failure of an inverter FETs and diagnoses whether the failure of the FET-short detecting section has occurred. The unit controls a motor through an inverter including a bridge having an upper-stage FETs and a lower-stage FETs via an MCU, having: an FET-short detecting section to detect a short failure of the upper-stage FETs and the lower-stage FETs based on respective connection point voltages of the upper-stage FETs and the lower-stage FETs; and a diagnostic function to detect a failure of the FET-short detecting section. The diagnostic function diagnoses the failure of the FET-short detecting section at start up and turns-OFF the upper-stage FETs and the lower-stage FETs when the failure is detected. The FET-short detecting section diagnoses the short failure of the upper-stage FETs and the lower-stage FETs when the failure of the FET-short detecting section is not detected.


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