The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 13, 2019

Filed:

Nov. 19, 2015
Applicant:

Hewlett-packard Development Company, L.p., Houston, TX (US);

Inventors:

Hsue-Yang Liu, Vancouver, WA (US);

Matthew A Shepherd, Vancouver, WA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 29/393 (2006.01); B41J 29/38 (2006.01); B41J 2/175 (2006.01); B41J 2/155 (2006.01); B41J 2/045 (2006.01);
U.S. Cl.
CPC ...
B41J 29/393 (2013.01); B41J 2/04505 (2013.01); B41J 2/04558 (2013.01); B41J 2/155 (2013.01); B41J 2/175 (2013.01); B41J 29/38 (2013.01); B41J 2029/3935 (2013.01);
Abstract

A method including printing a calibration pattern with a wide array printhead having a plurality of printhead dies. The method includes scanning the calibration pattern with a scanbar having a width less than a width of the wide array printhead by indexing the scanbar to a plurality of selected positions across a width of the calibration pattern and providing a scanned calibration image at each selected position, the calibration images together providing a scan of the full width of the calibration pattern, and measuring alignment between successive printhead dies based on the calibration images.


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