The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 13, 2019

Filed:

Oct. 15, 2015
Applicant:

Hewlett-packard Development Company, L.p., Houston, TX (US);

Inventors:

Alberto Arredondo, Les Franqueses del Valles, ES;

Eduardo Martin, Sabadell, ES;

Ricardo Sanchis, Masquefa, ES;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B65H 5/22 (2006.01); B41J 11/00 (2006.01); B65H 7/02 (2006.01);
U.S. Cl.
CPC ...
B41J 11/0085 (2013.01); B65H 5/224 (2013.01); B65H 7/02 (2013.01); B65H 2511/15 (2013.01); B65H 2515/342 (2013.01); B65H 2515/83 (2013.01); B65H 2557/61 (2013.01);
Abstract

A method and apparatus for calibrating a vacuum system in a printing device comprising obtaining a reference pressure value for a print zone of the printing device, measuring a calibration pressure value in the print zone of the printing device when the printing device is at an operating location and the vacuum system is in operation, determining an altitude based on the reference pressure value and the calibration pressure value and applying an operating setting to the vacuum system based on the determined altitude.


Find Patent Forward Citations

Loading…