The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 13, 2019

Filed:

Aug. 10, 2017
Applicant:

Hoowaki, Llc, Greenville, SC (US);

Inventors:

Ralph A. Hulseman, Greenville, SC (US);

Cameron L. McPherson, Easley, SC (US);

Nakul Ravikumar, Greenville, SC (US);

Assignee:

Hoowaki, LLC, Greenville, SC (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B25J 15/00 (2006.01); B22F 5/00 (2006.01); B22F 7/08 (2006.01);
U.S. Cl.
CPC ...
B25J 15/0028 (2013.01); B22F 5/00 (2013.01); B22F 7/08 (2013.01); B22F 2005/005 (2013.01);
Abstract

A microstructure arrangement for gripping low coefficient material comprising: a substrate disposed on a gripping surface; a set of pillars disposed on the substrate; and, wherein the set of pillars have the physical property of a grip force in excess of 50.0N with a contact area of 25% or less as determined by the friction testing method. A first set of pillars can be disposed on the substrate having a cross section area in the range of 100 μmto 160,000 μm, height relative to the substrate in the range of 10 μm to 400 μm, and a pitch determined from the center of the pillars, in the range of 20 μm to 1000 μm; and a secondary set of pillars disposed on the first set of pillars having a cross section area less than that of the pillars in the first set of pillars.


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