The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2019

Filed:

Apr. 05, 2018
Applicant:

At&t Intellectual Property I, L.p., Atlanta, GA (US);

Inventors:

Sarat Puthenpura, Berkeley Heights, NJ (US);

Jie Chen, Watchung, NJ (US);

Sam Houston Parker, Cranbury, NJ (US);

Huahui Wang, Bridgewater, NJ (US);

Wenjie Zhao, Princeton, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 64/00 (2009.01); G01S 5/10 (2006.01);
U.S. Cl.
CPC ...
H04W 64/00 (2013.01); G01S 5/10 (2013.01);
Abstract

Techniques for locating a mobile device using a time distance of arrival (TDOA) method with disturbance scrutiny are provided. In an aspect, for respective combinations of three base station devices of a number of base station devices greater than or equal to three, intersections in hyperbolic curves, generated using a closed form function with input values based on differences of distances from the device to pairs of base station devices of the respective combinations of three base station devices, are determined. The intersection points are then tested for robustness against measurement errors associated with the input values and a subset of the intersection points that are associated with a degree of resistance to the measurement errors are selected to estimate a location of the device.


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