The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2019

Filed:

Feb. 02, 2017
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Michael Bender, Rye Brook, NY (US);

Rahul Gupta, Austin, TX (US);

David B. Kumhyr, Austin, TX (US);

Leucir Marin Junior, Cedar Park, TX (US);

Arnaud A. Mathieu, Austin, TX (US);

Maharaj Mukherjee, Poughkeepsie, NY (US);

Michael P. Robertson, Austin, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04Q 9/00 (2006.01);
U.S. Cl.
CPC ...
H04Q 9/00 (2013.01); G08C 2201/93 (2013.01); H04Q 2209/25 (2013.01); H04Q 2209/84 (2013.01);
Abstract

A method, a computing system and a computer program product are provided for utilizing supplemental sensors to monitor conditions of an area employing a sensor network. One or more supplemental sensors that are external to the sensor network are detected in an area. The one or more supplemental sensors are added to the sensor network. Readings pertaining to the conditions of the area are retrieved from the detected one or more supplemental sensors and one or more first sensors included in the sensor network. The readings of the one or more supplemental sensors and the one or more first sensors are compared and a resulting condition of the area is determined based on the comparing.


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