The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2019
Filed:
Jun. 23, 2016
Fluke Corporation, Everett, WA (US);
Matthew F. Schmidt, River Falls, WI (US);
Fluke Corporation, Everett, WA (US);
Abstract
Systems and methods can be used to detect thermal anomalies in a target scene of an infrared image. Acquired thermal image data can be compared to a statistical thermal profile to detect thermal anomalies in the image data. Anomaly data based on the comparison can be used to generate an image representing locations and/or severity of detected anomalies. Systems can be used to acquire thermal image data for generating and/or updating statistical thermal profiles for use in anomaly detection processes. Auxiliary measurement devices can provide measurement data representative of one or more parameters of the target scene. The measurement data can be used to select from a plurality of possible statistical thermal profiles associated with the target scene to best match the current parameters of the scene.