The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2019
Filed:
Mar. 15, 2018
Kodak Alaris Inc., Rochester, NY (US);
Robert Johnson, Webster, NY (US);
John Jamieson, Rochester, NY (US);
KODAK ALARIS INC., Rochester, NY (US);
Abstract
Systems and methods facilitate iteratively inspecting a high resolution image of a camera subassembly glass element, to determine whether dust is present, and cleaning of same. By examining the size, number, and location of the dust particles it can be determined whether the dust is likely to cause issues when the camera subassembly is integrated into a fully assembled document scanner. Other anomalies, contaminants, and defects which could affect camera image quality, such as scratches on the glass covering, can also be detected. Software may control the capturing of the high resolution images of the camera subassembly glass and can determine a fail state if the anomaly is above a predetermined threshold. The systems and method can be used as acceptance criteria of individual camera subassemblies from a manufacturer.