The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2019

Filed:

Mar. 16, 2016
Applicant:

Futurewei Technologies, Inc., Plano, TX (US);

Inventors:

Baoling S. Sheen, Kildeer, IL (US);

Ying Li, Bridgewater, NJ (US);

Jin Yang, Bridgewater, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 12/24 (2006.01); H04W 24/10 (2009.01);
U.S. Cl.
CPC ...
H04L 41/0816 (2013.01); H04W 24/10 (2013.01);
Abstract

Embodiments of this disclosure filter a set of key performance indicators (KPIs) based on various criteria to reduce the number of root causes that are considered when adjusting the wireless configuration parameters. In particular, the set of KPIs may be filtered based on various criteria. In one example, KPIs having a hit-ratio below a hit-ratio threshold are removed from the set of KPIs. In another example, KPIs having a slope of linear regression below a threshold slope are removed from the set of KPIs. In yet another example, a KPI is removed from the set of KPIs when a causal relationship between the KPI and another KPI in the set of KPIs exceeds a threshold. In yet another example, a KPI is removed from the set of KPIs when the KPI has a prediction impact score that fails to exceed a prediction impact threshold.


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