The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2019
Filed:
Jun. 17, 2009
Applicants:
Hendrik Jan Jozef Hubertus Schepers, Eindhoven, NL;
Boris Skoric, Eindhoven, NL;
Inventors:
Hendrik Jan Jozef Hubertus Schepers, Eindhoven, NL;
Boris Skoric, Eindhoven, NL;
Assignee:
KONINKLIJKE PHILIPS ELECTRONICS N.V., Eindhoven, NL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 9/32 (2006.01); G06F 21/30 (2013.01); G06F 21/35 (2013.01); G06F 21/74 (2013.01); G06Q 30/00 (2012.01);
U.S. Cl.
CPC ...
H04L 9/3278 (2013.01); G06F 21/305 (2013.01); G06F 21/35 (2013.01); G06F 21/74 (2013.01); G06Q 30/0185 (2013.01); H04L 9/3218 (2013.01); G06F 2221/2105 (2013.01); G06F 2221/2121 (2013.01); G06F 2221/2129 (2013.01); H04L 2209/805 (2013.01);
Abstract
A physical uncloneable function (PUF) pattern is used for verifying a physical condition of an item. The PUF pattern is arranged to be damaged in the event that said item is exposed to a predetermined environmental condition. Verification of the physical condition of the item, is carried out by obtaining a measured response from the PUF pattern, and comparing the measured response with a stored response in respect of the PUF.