The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2019
Filed:
Oct. 19, 2017
Applicant:
Omron Corporation, Kyoto-shi, Kyoto, JP;
Inventors:
Akihiko Sano, Uji, JP;
Kohei Tomita, Kyoto, JP;
Tsuyoshi Takeuchi, Aso, JP;
Takuya Nakai, Hirakata, JP;
Akihiro Funamoto, Soraku-gun, JP;
Assignee:
OMRON Corporation, Kyoto-shi, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H02S 50/10 (2014.01); H02S 50/00 (2014.01);
U.S. Cl.
CPC ...
H02S 50/10 (2014.12); H02S 50/00 (2013.01);
Abstract
A storage unit stores a defect correlation table indicating what influence a given type of defect will have on the inspection of the other types of defects. When an obtainment unit obtains an inspection result of inspecting for a defect, an influence determination unit refers to the defect correlation table and determines the influence of the other types of defects on the inspection result. Information pertaining to the determined influence is outputted via an output unit.