The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2019
Filed:
May. 31, 2016
Boe Technology Group Co., Ltd., Beijing, CN;
Kun Cao, Beijing, CN;
Zhongyuan Wu, Beijing, CN;
BOE TECHNOLOGY GROUP CO., LTD., Beijing, CN;
Abstract
A judging method of array test reliability, comprising: Step 1, taking at least one of organic light emitting backplanes subjected to an array test as a sample substrate; Step 2, performing a scan on pixels of the sample substrate row by row and providing a data voltage signal; Step 3, detecting a current that is output to an anode of each pixel from a pixel circuit layer; Step 4, comparing the current that is output to the anode of each pixel from the pixel circuit layer with a predefined current, judging that the pixel is a defective pixel when the two are inconsistent; Step 5, comparing a judgment result of each pixel with a test result of the array test, judging that the array test is reliable when the two are consistent, judging that the array test is unreliable when the two are inconsistent.