The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2019
Filed:
Jan. 18, 2017
Canon Kabushiki Kaisha, Tokyo, JP;
Akinori Ohi, Toride, JP;
CANON KABUSHIKI KAISHA, Tokyo, JP;
Abstract
A measurement apparatus that is capable of positively generating a projection pattern suitable for a to-be-read object. A camera scanner as the measurement apparatus projects a projection pattern formed by a plurality of projection lines on a to-be-read object to thereby measure the bending of the to-be-read object. A distance to the to-be-read object is measured, and distance distribution information of the to-be-read object for identifying a shape, a size, and a position of the to-be-read object is generated based on the measured distance. The projection pattern is generated based on the generated distance distribution information of the to-be-read object.