The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2019

Filed:

Oct. 05, 2016
Applicant:

Keyence Corporation, Osaka, JP;

Inventor:

Masashi Nakao, Osaka, JP;

Assignee:

Keyence Corporation, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2017.01); G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G06T 7/74 (2017.01); G06T 2200/24 (2013.01); G06T 2207/10004 (2013.01); G06T 2207/30164 (2013.01);
Abstract

A feature portion desired by a user out of an inspection target image is accurately positioned. A standard region is set so as to surround a standard pattern in a standard image of a product to be a standard for an inspection target. A sorting region, which is a region for sorting a plurality of candidates similar to the standard pattern, is set in the inspection image. The standard pattern is searched from the inspection image, to extract a plurality of candidates similar to the standard pattern. The sorting region is disposed with respect to each of the plurality of candidates for the standard pattern, extracted in the extraction step, to sort a candidate for the standard pattern based on an evaluation value of the sorting region disposed with respect to each of the plurality of candidates for the standard pattern.


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