The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2019
Filed:
Mar. 25, 2016
Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;
Moon-Su Kim, Gimpo-si, KR;
Naya Ha, Seoul, KR;
Jong-Ku Kang, Suwon-si, KR;
Andrew Paul Hoover, Austin, TX (US);
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, Gyeonggi-Do, KR;
Abstract
A method of analyzing an integrated circuit, which is implemented by a computing system or a processor, wherein an interconnection of a first net of the integrated circuit includes at least one conducting segment corresponding to one wiring layer or one via, includes receiving a plurality of resistances and a plurality of capacitances, which correspond to the first net, based on a process variation, counting a number of conducting segments corresponding to the first net, and calculating a first resistance or a first capacitance of the first net, based on the number of conducting segments, the plurality of resistances, and the plurality of capacitances.