The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10372584 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 06, 2019

Filed:

Jan. 30, 2015
Applicant:

Hitachi, Ltd., Chiyoda-ku, Tokyo, JP;

Inventor:

Masataka Nishi, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3608 (2013.01);
Abstract

While the effectiveness of a model inspection method as a means for detecting software defects is known, large-scale software cannot be handled due to great amounts of calculation required for inspection. According to the present invention, after a model inspection problem of software is attributed to be a satisfiability determination problem, the problem is converted to a type that can be solved by a solver used for solving a notification optimization problem having constrained conditions, and the satisfiability is determined in a numerically analytical manner.


Find Patent Forward Citations

Nishi, Masataka. (2019). Software inspection apparatus (U.S. Patent No. 10372584). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10372584

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