The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2019
Filed:
Nov. 30, 2016
Amazon Technologies, Inc., Seattle, WA (US);
Nitin Kesarwani, Seattle, WA (US);
Sharon Xuelun Yang, Seattle, WA (US);
Wei Huang, Shoreline, WA (US);
Amazon Technologies, Inc., Seattle, WA (US);
Abstract
A prediction model testing system includes a test environment that is used to test a prediction model under test (PMUT). A metrics collector in a production environment collects and stores production metrics data generated from computing resources in a production environment. A production predictor in the production environment generates production predictions for the metrics, using a production prediction model. A test manager may make the production metrics data available in a test environment. Test predictions are generated in the test environment from the metrics data using the PMUT. The test manager may then calculate respective prediction errors of the production prediction model and the PMUT, and generate a report indicating the differences between the two sets of prediction errors. The report may be used by the test management system to determine whether a test of the PMUT was successful.