The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2019
Filed:
Oct. 28, 2013
Emc Corporation, Hopkinton, MA (US);
Chao Chen, Shanghai, CN;
Yu Fu, Shanghai, CN;
Jove Qianjie Zhong, Shanghai, CN;
Jingjing Liu, Shanghai, CN;
Qiyan Chen, Shanghai, CN;
EMC IP Holding Company LLC, Hopkinton, MA (US);
Abstract
The present invention provides a method and system for information analysis. The method extracts a plurality of metadata from a source information set so as to generate a metadata set, the metadata comprising error log information that forms an error sequence in the metadata set; and generates a common error sequence set for a plurality of the metadata sets. By means of the method, it is possible to easily obtain a global error sequence pattern, and easily compare a new error with a previous error sequence pattern so as to prevent, diagnose and recover the new error.