The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2019
Filed:
Nov. 15, 2016
Leica Instruments (Singapore) Pte. Ltd., Singapore, SG;
Qingsong Zou, Singapore, SG;
Anthony Lim, Singapore, SG;
Apria Laksono, Singapore, SG;
Michelle Li, Singapore, SG;
Andreas Klopfer, Doren, AT;
Vincent Vaccarelli, Getzville, NY (US);
LEICA INSTRUMENTS (SINGAPORE) PTE. LTD., Singapore, SG;
Abstract
A microscope arrangement includes a plurality of microscopes arranged in a geometric pattern. A control device has a display screen and a data link. The data link connects the microscopes to the control device and is configured to transfer microscopy data at least from the microscopes to the control device. The display screen comprises display symbols. Each display symbol represents microscopy data received by the control device from a different one of the microscopes. The display symbols are, in at least one operational state of the control device, arranged moveable on the display screen and are adapted to be moved into the geometric pattern.