The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2019
Filed:
Dec. 21, 2011
Dean M. Homan, Sugar Land, TX (US);
Mark T. Frey, Sugar Land, TX (US);
Sergiy Kryukov, Houston, TX (US);
Dean M. Homan, Sugar Land, TX (US);
Mark T. Frey, Sugar Land, TX (US);
Sergiy Kryukov, Houston, TX (US);
SCHLUMBERGER TECHNOLOGY CORPORATION, Sugar Land, TX (US);
Abstract
A logging tool having a plurality of spatially separated antennas is provided and used to make propagation-style measurements in a formation. Tensors are formed using the propagation-style measurements and one or more quantities are computed using the tensors. A formation evaluation is performed using the computed quantities. The formation evaluation determines a formation property or parameter such as horizontal resistivity, vertical resistivity, relative dip, azimuthal dip, bed boundary location, or bed thickness. The computed quantities may include compensated phase shift resistivity, compensated attenuation resistivity, symmetrized phase shift resistivity, symmetrized attenuation resistivity, anti-symmetrized phase shift resistivity, and anti-symmetrized attenuation resistivity. The measurements may be corrected for antenna gain errors and an air calibration may be performed. A zero-dimension inversion may be performed, while drilling, and the determined horizontal resistivity, vertical resistivity, relative dip, and/or azimuthal dip information may be sent to an uphole processor in real-time.