The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2019

Filed:

May. 29, 2018
Applicant:

Korea Electronics Technology Institute, Seongnam-si, Gyeonggi-do, KR;

Inventors:

Chuljong Han, Yongin-si, KR;

Jeongno Lee, Yongin-si, KR;

Minsuk Oh, Seoul, KR;

Byungwook Yoo, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/20 (2006.01); G21K 4/00 (2006.01); A61B 6/00 (2006.01); G01T 1/24 (2006.01); G01T 1/16 (2006.01);
U.S. Cl.
CPC ...
G01T 1/2002 (2013.01); A61B 6/4208 (2013.01); G01T 1/1606 (2013.01); G01T 1/2018 (2013.01); G01T 1/24 (2013.01); G21K 4/00 (2013.01);
Abstract

Disclosed are a scintillator using semiconductor quantum dots, a method of manufacturing the scintillator, and a digital image diagnostic system employing the scintillator. In one aspect, the scintillator includes a metallic reflection film made of a metal configured to transmit an X-ray and reflecting visible light and having a plurality of voids formed in a thickness direction. The scintillator also includes a polymer film formed inside the plurality of voids and being configured to include a plurality of columnar structures to convert the X-ray into the visible light. The scintillator further includes semiconductor quantum dots dispersed in the polymer film and having a decay time of tens of nanoseconds.


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