The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2019

Filed:

Feb. 21, 2013
Applicant:

Lockheed Martin Corporation, Bethesda, MD (US);

Inventors:

Charles Apker, Owego, NY (US);

Mark Bullock, Owego, NY (US);

Steven Pratt, Owego, NY (US);

David D. Schmidt, Owego, NY (US);

Matthew Stafford, Owego, NY (US);

Scott O. Sorber, Vestal, NY (US);

Assignee:

Lockheed Martin Corporation, Bethesda, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 19/23 (2010.01); H01Q 3/26 (2006.01);
U.S. Cl.
CPC ...
G01S 19/23 (2013.01); G01S 19/235 (2013.01); H01Q 3/267 (2013.01);
Abstract

An apparatus for performing calibration of an antenna array having a plurality of antennas including at least a first antenna and a second antenna. The apparatus includes a global navigation satellite system receiver configured to measure a first phase of a first signal received by the first antenna from a satellite and a second phase of a second signal received by the second antenna from the satellite. The apparatus also includes at least one processor configured to receive the first phase and the second phase from the global navigation satellite system receiver and to operate in a calibration mode to determine a difference between the first and second phases.


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