The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2019
Filed:
Mar. 28, 2014
Mitsubishi Electric Corporation, Chiyoda-ku, JP;
Masayuki Saito, Tokyo, JP;
Masakazu Miya, Tokyo, JP;
Yuki Sato, Tokyo, JP;
Seigo Fujita, Tokyo, JP;
Kazuhiro Terao, Tokyo, JP;
MITSUBISHI ELECTRIC CORPORATION, Chiyoda-ku, JP;
Abstract
An observation data screening unit () executes least squares method positioning using, as an observation amount, n (n is an integer of 3 or larger) number of single difference amounts of an L1-wave pseudorange obtained from n pieces of observation data from n number of positioning satellites and n pieces of correction data corresponding to the n pieces of the observation data. The observation data screening unit () calculates a sum of squares of n residuals obtained for each positioning satellite by executing the least squares method positioning and normalizes the n residuals. The observation data screening unit () then evaluates the sum of squares of the residuals and the n normalized residuals.