The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2019
Filed:
Aug. 31, 2018
International Business Machines Corporation, Armonk, NY (US);
Steven M. Douskey, Rochester, MN (US);
Mary P. Kusko, Hopewell Junction, NY (US);
Matthew B. Schallhorn, Greensboro, NC (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and test circuit are provided for implementing enhanced scan data testing with minimization of over masking in an on product multiple input signature register (OPMISR) test, and a design structure on which the subject circuit resides. Common Channel Mask Scan Registers (CMSR) data is used with a multiple input signature register (MISR) in each satellite. A test algorithm control is used for implementing enhanced scan data testing by independently skewing scan unload shifting of selected OPMISR+ satellite by selected cycles. With this modified shifting, for the same test or a repeated run of the test, Channel Mask Enable (CME) triggered masking lines up on a different bit position in channels of each satellite avoiding over masking.