The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2019
Filed:
Dec. 14, 2015
Nuctech Company Limited, Beijing, CN;
Li Zhang, Beijing, CN;
Xin Jin, Beijing, CN;
Huaping Tang, Beijing, CN;
Qingping Huang, Beijing, CN;
Yunda Sun, Beijing, CN;
Zhiqiang Chen, Beijing, CN;
NUCTECH COMPANY LIMITED, Beijing, CN;
Abstract
The present disclosure discloses a radiography system including: a ray source, comprising a plurality of X-ray generators which are distributed on one or more planes intersected with a moving direction of an object being inspected; a detector module comprising a plurality of detection units; a data collection circuit; a controller, configured to control at least two X-ray generators of the plurality of X-ray generators in the ray source to generate X-rays alternately such that the object is scanned by the generated X-rays; and control the detector module and the data collection circuit to respectively obtain detection data corresponding to the at least two X-ray generators; and a data processing computer, configured to create images of the object being inspected in view angles of the at least two X-ray generators based on the detection data. The above embodiments may implement a multi-view-angle perspective imaging system within a single scan plane by utilizing a distributed X-ray source and reuse of the detectors.