The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2019

Filed:

Mar. 10, 2015
Applicant:

Technology Research Association for Future Additive Manufacturing, Tokyo, JP;

Inventors:

Hiroshi Ohno, Yokohama, JP;

Yuji Sasaki, Yokohama, JP;

Mitsuo Sasaki, Yokohama, JP;

Takashi Obara, Yokohama, JP;

Kazuyuki Masukawa, Yokohama, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/94 (2006.01); G01N 21/15 (2006.01); B23K 26/70 (2014.01); B23K 26/03 (2006.01); B23K 26/06 (2014.01); B23K 26/14 (2014.01); B23K 26/21 (2014.01); G02B 5/08 (2006.01); G02B 19/00 (2006.01); G02B 27/00 (2006.01); G01N 21/71 (2006.01); G01N 21/954 (2006.01); G01N 21/17 (2006.01);
U.S. Cl.
CPC ...
G01N 21/94 (2013.01); B23K 26/03 (2013.01); B23K 26/0643 (2013.01); B23K 26/0648 (2013.01); B23K 26/1476 (2013.01); B23K 26/21 (2015.10); B23K 26/707 (2015.10); G01N 21/15 (2013.01); G02B 5/08 (2013.01); G02B 19/0052 (2013.01); G02B 19/0076 (2013.01); G02B 27/0006 (2013.01); G01N 21/718 (2013.01); G01N 21/954 (2013.01); G01N 2021/1757 (2013.01);
Abstract

An optical processing head that detects a trouble of an optical processing head that will be generated at the time of optical processing before the trouble occurs is disclosed. The optical processing head that performs processing by condensing, on a process surface, a ray emitted by a light source for processing includes a cylindrical housing that surrounds a ray for processing emitted by the light source for processing, a ray emitter for inspection that is incorporated in the cylindrical housing and arranged outside the path of the ray for processing, and a light receiver that is incorporated in the cylindrical housing, arranged outside the path of the ray for processing, and receives a ray for inspection emitted by the ray emitter for inspection. The contamination of the inner surface of the cylindrical housing or the concentration of a scattering object flowing into the cylindrical housing is inspected by using a signal acquired from the light receiver.


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