The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 2019
Filed:
Apr. 13, 2016
Sacmi Cooperativa Meccanici Imola Societa' Cooperativa, Imola, IT;
Sanzio Caroli, Castel San Pietro Terme, IT;
Massimo Balducci, Imola, IT;
Abstract
An apparatus () for optical inspection of objects (), in particular metal lids, comprises: a camera () oriented according to a vertical viewing axis () to see the object () to be inspected positioned in an inspection station () and to capture an image of the object (); a first illuminator () irradiating grazing light at a first frequency a second illuminator () irradiating top-down light at a second frequency different from the first frequency; a third illuminator () irradiating diffused light at a third frequency different from the first and second frequencies; a processor connected to the camera () for processing the captured image and deriving a first, a second and a third filtered image corresponding to the illumination contributions of the first, second and third illuminators (), respectively and separately. The third illuminator () is mounted on a three-dimensional surface around the inspection station () and around an optical path defined by the camera (), so that the emitted light rays are inclined at a plurality of different inclination angles to subject the object () in the inspection station () to diffused light at the third frequency.