The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2019

Filed:

Jan. 20, 2017
Applicant:

Timegate Instruments Oy, Oulu, FI;

Inventors:

Juha Kostamovaara, Oulu, FI;

Ilkka Nissinen, Oulu, FI;

Jan Nissinen, Oulu, FI;

Rami Aikio, Vtt, FI;

Jussi Tenhunen, Vtt, FI;

Lauri Kurki, Vtt, FI;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/44 (2006.01); G01N 21/65 (2006.01); G01J 1/44 (2006.01);
U.S. Cl.
CPC ...
G01N 21/65 (2013.01); G01J 3/44 (2013.01); G01J 2001/442 (2013.01);
Abstract

An apparatus, includes an illuminating light source and illuminating optics arranged to illuminate a sample region with illuminating light pulses, light gathering optics to gather Raman scattered light pulses from the sample region, a spectral disperser and a detector array for measuring the spectral intensity distribution of Raman scattered light pulses obtained from the sample region and an auxiliary detector for providing an indicator signal indicative of elastic scattering coefficient of the sample region. The apparatus is arranged to form a first output spectrum from the spectral intensity distribution of a first group of Raman scattered light pulses. The pulses of the first group of Raman scattered light pulses are obtained from the sample region when the indicator signal indicates that an object is located in the sample region.


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